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Focused Ion Beam Scanning Electron Microscope

Contract Award

Γενικές Πληροφορίες

   Oct 14, 2024
   Ολλανδικά
   Άλλες
   published: Oct 14, 2024

Προτότυπο Κείμενο

Terug naar overzicht13 okt. 2024 - Aankondiging gegunde opdracht - algemene richtlijn, standaardregelingGefocusseerde ionenbundel scanning-elektronenmicroscoopStichting Nederlandse Wetenschappelijk Onderzoek Instituten (NWO-I) Deel op LinkedIn DetailsPublicatieDocumentenVraag en antwoordOmschrijvingIn het kader van de groeifonds subsidie Quantum Delta NL investeert het AMOLF Nano Lab Amsterdam in...
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   FEI Europe B.V
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